test pattern的例句大全

A new automatic test pattern generation ( ATPG) methodology based on chaotic neural network method is described.

阐述了一种基于混沌神经网络的自动测试生成（ATPG）算法。

Delay Test Pattern Generation Considering Crosstalk-induced Effects

考虑串扰影响的时延测试

RTL test pattern generation algorithm based on CRG model

基于CRG模型的RTL测试矢量生成算法

Test pattern generation program

测试码模式生成程序

In this paper a new test pattern generation method is proposed, which can greatly reduce the power dissipation during test mode and has no impact on the fault coverage.

本文提出了一种面向功耗优化的伪随机测试向量生成方法，在保证故障覆盖率的条件下，大大降低了测试功耗。

Neural Network Method of Test Pattern Generation and Some Problems in Design

测试产生的神经网络方法及若干问题研究

Research on Faulty Test Pattern Generation Methods for Digital Circuits

数字电路的故障测试模式生成方法研究

Study on Automatic Test Pattern Generation for Digital Circuit Based on Ant Colony Algorithm

基于蚁群算法的数字电路测试模式生成研究

Research on Test Pattern Generation of Asynchronous Circuit

异步时序电路测试生成研究

Comparing Automatic Test Pattern Generation System

数字电路测试向量自动生成系统的比较

This paper presents a test pattern generation system implemented on a CAD workstation.

本文介绍了一个在康发工作站实现的测试产生系统COMPA-ATPGS。

Research on Microprocessor Test Pattern Generation

微处理器测试图案产生方法研究

Automatic Test Pattern Generation for Multi-Clock Digital System Based on SCCT

基于安全充分捕获技术的多时钟数字系统测试矢量生成

This paper summarizes some new developments in the area of test pattern generation during the past years.

本文综述近几年来国际上在测试产生方法的研究方面的新进展。

On Finite Backtracking Test Pattern Generation Method

论有限回溯测试模式产生方法

An efficient algorithm of test pattern generation for MOS circuits with incomplete scan structure

一个有效的不完全Scan结构MOS电路的测试生成算法

The Pseudorandom Test Pattern Generation Oriented to Power Dissipation

面向功耗优化的伪随机测试矢量生成

The test pattern generation algorithms for combinational logic circuit and the fault types were discussed.

讨论了组合逻辑电路的故障诊断的方法，故障的类型。

Test Pattern Generation in Built-In Self-Test with Multiple Scan Chains

基于多扫描链的内建自测试技术中的测试向量生成

Test Pattern generation for single stuck at fault in N bit adders is discussed.

针对单个stuck－at故障，研究了N位加法器的测试矢量生成问题。